Twenty observations on etch uniformity on silicon wafers are taken during a qualification experiment for a plasma etcher. The data are as follows:
5.34 6.65 4.76 5.89 7.25
6.00 7.55 5.54 5.62 6.21
5.97 7.35 5.44 4.39 4.98
5.25 6.35 4.61 6.00 5.32
Check normality by constructing a normal probability plot....
DATE
Question answered on Jul 22, 2018
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Solution~000542817.zip (18.37 KB)
